WaveMaster® Plan
平面光学系 波面収差測定装置
WaveMaster Planは、平面板やウェッジなどの平面光学系の品質管理に適しています。このシステムは、内蔵のシャックハルトマン（Shack-Hartmann）センサーを使用して、サンプルの透過波面を測定します。
Key Features
- ・Comprehensive analysis of planar optical elements
- ・Rapid measurement speed for high sample throughput
- ・Sample holder for alignment in the submicron range.
- ・Only minimal realignment of samples is required for wavefront measurements of sample series.
- ・High measurement accuracy of the Shack-Hartmann sensor
- ・Real-time comparison between wavefront data and sample lenses or design values
- ・Collimated light source
- ・Vibration-resistant design
- ・Comprehensive software functions for measurement and analysis
- ・Simple and rapid measurement of planar elements. If adjustment is needed, then only center the sample roughly on the sensor